Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-05-10
2010-11-02
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C439S066000
Reexamination Certificate
active
07825676
ABSTRACT:
A contact terminal formed of an electrically conductive material is arranged in each of a plurality of holed of a contactor substrate. An electrically conductive part is formed on an inner surface of each hole. The contact terminal has a first contact part that contacts a terminal of an electronic part and a second contact part that contacts the electrically conductive part in a middle portion. When the contact terminal bends by the first contact part being pressed, the second contact part contacts the electrically conductive part of the contactor substrate and an appropriate degree of contact pressure is obtained.
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Chinese Office Action Jun. 27, 2008 (English Translation Provided).
“Japanese Office Action” corresponding to Japanese Application No. 2006-544721, with English translation, mailed dated Feb. 23, 2010.
Kohashi Naohito
Koizumi Daisuke
Kumatabara Takumi
Tashiro Kazuhiro
Fujitsu Patent Center
Fujitsu Semiconductor Limited
Nguyen Ha Tran T
Vazquez Arleen M
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