Contactless test method for integrated circuits

Details Contactless test method for integrated circuits Contactless test method for integrated circuits

1974-02-12

1976-05-11

Rolinec, R. V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 324158D, G01R 3126

Patent

active

039566986

ABSTRACT:
A method is provided for contactless testing of an integrated circuit by fabricating, integrally with the integrated circuit, semiconductor switch elements, that is, thyristors, transistors and combinations thereof, that are connected to power and/or signal electrical inputs of the integrated circuit. Base regions of the switch elements are selectively exposed to a fine-dimensioned electron beam to switch the elements and supply desired electrical inputs at the connected inputs of the integrated circuit. The integrated circuit can thus be selectively tested preferably by segments and modules. After testing, the switch elements are disconnected from the integrated circuit, and the integrated circuit selectively connected preferably while accommodating and passivating defective components and modules of the circuit.

REFERENCES:
patent: 3506971 (1970-04-01), Sakurai
patent: 3549999 (1970-12-01), Norton
patent: 3678384 (1972-07-01), Oatley
patent: 3772520 (1973-11-01), Varker
patent: 3801910 (1974-04-01), Quinn
Donath, W. E.; "Testing of Integrated Circuits"; IBM Tech. Dis. Bull.; Vol. 8; No. 8; Jan. 1966.

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