Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1975-02-27
1977-10-11
Rolinec, Rudolph V.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 73R, G01R 3126, G01R 1512
Patent
active
040538338
ABSTRACT:
A method is provided for contactless testing of an integrated circuit by fabricating, integrally with the integrated circuit, at least one and preferably a plurality of conductive semiconductor elements that are electrically connected between power and/or signal sources and inputs to the integrated circuit, and that are adapted to electrically conduct when exposed to a radiation beam. The conductive elements are selectively exposed by at least one radiation beam, such as an electron or light beam, to cause the conductive elements to electrically conduct and supply desired electrical inputs at the connected inputs of the integrated circuits; and the electrical responses of at least a segment of the integrated circuit to said electrical input are measured to determine whether said circuit segment possesses specified electrical characteristics. The integrated circuit can thus be selectively and sequentially tested by segments and modules. After testing, the conductive semiconductor elements are preferably disconnected from the integrated circuit, and the integrated circuit selectively connected electrically while accommodating and passivating defective components and modules of the circuit.
REFERENCES:
patent: T930006 (1975-01-01), Beaufrere et al.
patent: 3801910 (1974-04-01), Quinn
Donath, W. E.; "Testing of Integrated Circuits"; IBM Tech. Disc. Bull., Jan. 1966; p. 1166.
Green David
Handy Robert M.
Malmberg Paul R.
Stoneburner Donald F.
Karlsen Ernest F.
Menzemer C. L.
Rolinec Rudolph V.
Westinghouse Electric Corporation
LandOfFree
Contactless test method for integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Contactless test method for integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contactless test method for integrated circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-741733