Optics: measuring and testing – Photometers
Patent
1998-04-09
2000-03-07
Font, Frank G.
Optics: measuring and testing
Photometers
356375, G01J 190
Patent
active
060347651
ABSTRACT:
A contactless position and displacement measuring device includes at least one light source and at least one photosensor adapted to move relative to each other. When illuminated by a light beam emitted by the light source the photosensor generates at least one electrical signal representative of the position of the light source relative to the photosensor. The sensor includes a plurality of layers deposited onto a support, namely at least one resistive first layer to form a potentiometer track, at least one photosensitive second layer to deliver electrical charges when it is illuminated by the light beam emitted by the source and at least one metallic third layer to collect the electrical charges generated by the photosensitive second layer.
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patent: 4961096 (1990-10-01), Idesawa
patent: 5541652 (1996-07-01), Jackson et al.
Patent Abstracts of Japan, vol. 8, n.degree. 139, Jun. 28, 1984, & JP 59 050579 (Komatsu Seisakusho K.K.) Mar. 23, 1984.
Patent Abstracts of Japan, vol. 12, n.degree. 396, Oct. 21, 1988 & JP 63 137319 (Kyocera Corp), Jun. 9, 1988.
Patent Abstracts of Japan, vol. 11, n.degree. 122, Apr. 16, 1987 & JP 61 269384 (Nissan Motor Co Ltd), Nov. 28, 1986.
Patent Abstracts of Japan, vol. 15, n.degree. 179, May 8, 1991 & JP 03 042879 (Yamatake Honeywell Co Ltd), Feb. 25, 1991.
Font Frank G.
Nguyen Tu T.
Vishay SA
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