Contactless optical probe for use in semiconductor...

Details Contactless optical probe for use in semiconductor... Contactless optical probe for use in semiconductor...

2005-02-15

2005-02-15

Nguyen, Kiet T (Department: 2881)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120

Reexamination Certificate

active

06856159

ABSTRACT:
A method and/or device (285) for determining first and second band offsets (100, 110) at a semiconductor/dielectric heterointerface (115), which includes the semiconductor/dielectric heterointerface (115) exposed to incident photons (205) from a light source (200); a detector (275, 280) for generating a signal by detecting emitted photons (260, 265) from the semiconductor/dielectric heterointerface (115); and an element (310) for changing the energy of incident photons (205) to monitor the first and second band offsets (100, 110).

REFERENCES:
patent: 4758092 (1988-07-01), Heinrich et al.
patent: 5283141 (1994-02-01), Yoon et al.
patent: 5416337 (1995-05-01), Chang et al.
patent: 5500188 (1996-03-01), Hafeman et al.
patent: 5519334 (1996-05-01), Dawson
patent: 5559428 (1996-09-01), Li et al.
patent: 5705831 (1998-01-01), Uemura et al.
patent: 5750981 (1998-05-01), Fonash
patent: 5770946 (1998-06-01), Patterson
patent: 5867034 (1999-02-01), Sokolov et al.
patent: 5872360 (1999-02-01), Paniccia et al.
Wang, W., et al, “Wavelength Selective Alteration of the Si(001)/SiO2Interface by Intense Tunable Infrared Radiation” APS Mtg. Mar. 18, 1998 in L.A published on Web.
Wang, W., et al, “Coupled Electron-Hole Dynamics at the Si/SiO2Interface” Physical Review Letters, vol. 81, No. 19, Nov. 9, 1998.
International Search Report PCT/US00/06879 dated May 16, 2000.

Affiliated with

Also associated with

Rating

Contactless optical probe for use in semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contactless optical probe for use in semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contactless optical probe for use in semiconductor... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3511838