Contactless interfacing of test signals with a device under...

Details Contactless interfacing of test signals with a device under... Contactless interfacing of test signals with a device under...

2004-02-05

2008-12-16

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C714S733000, C714S734000, C257S048000

Reexamination Certificate

active

07466157

ABSTRACT:
An interface device receives test data from a tester. A signal representing the test data is transmitted to a device under test through electromagnetically coupled structures on the interface device and the device under test. The device under test processes the test data and generates response data. A signal representing the response data is transmitted to the interface device through electromagnetically coupled structures on the device under test and the interface device.

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