Measuring and testing – Gas analysis – Moisture content or vapor pressure
Reexamination Certificate
2007-12-04
2007-12-04
Larkin, Daniel S. (Department: 2856)
Measuring and testing
Gas analysis
Moisture content or vapor pressure
C073S023200, C073S024010, C073S024060, C073S031010, C073S031050
Reexamination Certificate
active
10726038
ABSTRACT:
The invention provides a contactless sensor device operable for sensing water vapor or a predetermined chemical vapor including a thin film, wherein the thin film includes a nanostructured sensing layer and a soft magnetic layer disposed directly adjacent to the nanostructured sensing layer. The thin film has a first mass, a first density, and a first magnetostrictive resonance frequency prior to the nanostructured sensing layer adsorbing a predetermined amount of a predetermined vapor and a second mass, a second density, and a second magnetostrictive resonance frequency subsequent to the nanostructured sensing layer adsorbing the predetermined amount of the predetermined vapor. The sensor device also includes a driving coil disposed indirectly adjacent to and at a predetermined distance from the thin film, the driving coil operable for generating an alternating-current magnetic field used to query a shift in the magnetostrictive resonance frequency of the thin film. The sensor device further includes a measuring coil disposed indirectly adjacent to and at a predetermined distance from the thin film, the measuring coil operable for measuring and quantifying the shift in the magnetostrictive resonance frequency of the thin film.
REFERENCES:
patent: 5821129 (1998-10-01), Grimes et al.
patent: 6359444 (2002-03-01), Grimes
patent: 6393921 (2002-05-01), Grimes et al.
patent: 6397661 (2002-06-01), Grimes et al.
patent: 2002/0166382 (2002-11-01), Bachas et al.
patent: 2004/0105807 (2004-06-01), Fan et al.
Efremov, M. Yu., “Discrete Periodic Melting Point Observations for Nanostructure Ensembles,” Physical Review Letters, vol. 85, No. 17, pp. 3560-3563, Oct. 23, 2000.
Kwan, A.T., “Nanoscale Calorimetry of Isolated Polyethylene Single Crystals,” Journal of Polymer Science: Part B: Polymer Physics, vol. 39, pp. 1237-1245, Mar. 22, 2001.
Fletcher Yoder
General Electric Company
Larkin Daniel S.
LandOfFree
Contactless humidity/chemical vapor sensor device and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Contactless humidity/chemical vapor sensor device and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contactless humidity/chemical vapor sensor device and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3893385