Contactless hall coefficient measurement apparatus and method fo

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage

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G01R 2922

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047852321

ABSTRACT:
A method and apparatus for the contactless, non-destructive measurement of Hall coefficient and resistivity of a piezoelectric semiconductor sample. The material to be tested is formed in a disk which is supported at its edge by a holder. The disc is free to vibrate. Two pairs of electrodes, placed above and below the sample, excite the sample into and beyond piezoelectric resonance. Then a magnetic field is applied to the sample and the sample again driven into and beyond resonance. Comparison between the performance of the disk before and after application of the magnetic field yields data from which Hall coefficient can be determined.

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patent: 4092588 (1978-05-01), Desormiere et al.
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patent: 4353027 (1982-10-01), Ballato et al.
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Ballato et al., "Lateral Field Equivalent Networks and Piezo-Coupling Facs of Quartz Plates Driven in Simple Thickness Modes", IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, vol. UFFC-33, No. 4, Jul. 1986, pp. 385-393.
"A Method of Measuring Specific Resistivity and Hall Effect of Discs of Arbitrary Shape" by L. J. van der Pauw; Philips Res. Repts. 13, Feb. 1958, pp. 1-9.
"A Method of Measuring the Resistivity and Hall Coefficient on Lamellae of Arbitrary Shape" by L. J. van der Pauw: vol. 20, Philip Technical Review, pp. 220-224, 1958/59.

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