Contactless facilities for determining the specific resistance o

Details Contactless facilities for determining the specific resistance o Contactless facilities for determining the specific resistance o

1976-10-01

1978-02-21

Krawczewicz, Stanley T.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

324 57Q, 324 61QL, G01R 2702

Patent

active

040755576

ABSTRACT:
A rapid and accurate technique for generating indications representative of the specific resistance of a test sample, such as a silicon disc, is described. A capacitive probe is electrostatically coupled to the sample, and the input terminals of the probe are coupled to the output terminals of a reactive circuit that is excited with a high-frequency current and that includes a capacitive path connected across an input coil to transform the measured loss resistance of the sample (proportional to the specific resistance) to the terminals of the first coil. An auxiliary path including a pair of serially connected compensating inductors is connected between the junction of the capacitors in the capacitive path and a reference terminal of the input coil, with the junction of the compensating coils and the reference terminal forming the output of the reactive circuit. When the compensating inductances are individually adjusted to resonate with the coupling capacitance between the probe and the test sample and with the probe capacitance, respectively, at the frequency of excitation of the reactive circuit, the change in voltage across the capacitive path when the probe is connected to the output of the reactive circuit varies as a function of the specific resistance of the sample.

REFERENCES:
patent: 3151292 (1964-09-01), Orr
patent: 3234461 (1966-02-01), Trent et al.
patent: 3400331 (1968-09-01), Harris
patent: 3437920 (1969-04-01), Anderson
patent: 3544893 (1970-12-01), Savin et al.
patent: 4000458 (1976-12-01), Miller et al.

Affiliated with

Also associated with

Rating

Contactless facilities for determining the specific resistance o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contactless facilities for determining the specific resistance o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contactless facilities for determining the specific resistance o will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-128763