Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-12
2009-12-08
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S555000, C324S072500
Reexamination Certificate
active
07629796
ABSTRACT:
Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.
REFERENCES:
patent: 4262254 (1981-04-01), Poss
patent: 4656416 (1987-04-01), Brasfield
patent: 6812685 (2004-11-01), Steber et al.
patent: 6825673 (2004-11-01), Yamaoka
patent: 2006/0132151 (2006-06-01), Wang
patent: A 62-21069 (1987-01-01), None
Choi Hee Dok
Eun Tak
Kim Seong Jin
Lee Dong Jun
Song Dae Woong
Microinspection Inc.
Nguyen Vincent Q
Oliff & Berridg,e PLC
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