Contact-type film probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

07084653

ABSTRACT:
A contact-type film probe including a plastic substrate. Multiple signal transmission lines are arranged on one face of the substrate. Each signal transmission line penetrates through a section of the substrate near one end thereof. Each signal transmission line is coated with an insulating layer. A conductive layer is disposed on the other face of the substrate corresponding to each signal transmission line. The conductive layer is electrically connected with the signal transmission line. A contact conductive layer is further overlaid on each conductive layer. The contact conductive layers serve to directly electrically contact with the wires of the liquid crystal display to be tested.

REFERENCES:
patent: 6420884 (2002-07-01), Khoury et al.

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