Contact-type film probe

Details Contact-type film probe Contact-type film probe

2006-10-10

2006-10-10

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S762010

Reexamination Certificate

active

07119562

ABSTRACT:
A contact-type film probe including a plastic substrate and multiple signal lines arranged on one face of the substrate. A contact conductive layer is disposed at one end of each signal line. A buffer layer is disposed between the contact conductive layer and the substrate. The other section of the signal line free from the contact conductive layer is coated with an insulating layer. By means of the buffer layer, when contacting with the wires of the liquid crystal display, the force is fully evenly exerted onto the contact conductive layers and the direct contact force exerted onto the contact conductive layers is reduced so as to prolong the using life of the contact-type film probe.

REFERENCES:
patent: 5539676 (1996-07-01), Yamaguchi
patent: 6046599 (2000-04-01), Long et al.
patent: 6188232 (2001-02-01), Akram et al.
patent: 6256882 (2001-07-01), Gleason et al.
patent: 6853205 (2005-02-01), Cheng et al.

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