Contact structure and production method thereof and probe...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead

Reexamination Certificate

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C257S690000, C438S125000

Reexamination Certificate

active

06917102

ABSTRACT:
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors attached to a contactor carrier. The contactors are inserted in diagonal through holes on the contactor carrier and attached to the contactor carrier through adhesives. The contactor has a top end having a flat top surface, a straight diagonal beam integral with the top end and configured by an upper beam portion and a lower beam portion, and a lower end at an end of the lower beam portion to contact with a contact target. A length of the upper beam portion and a length of the lower beam portion are about the same. A probe contact assembly using the contact structure is also disclosed which incorporates a flip chip bonding technology to interconnect the components therein.

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