Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Reexamination Certificate
2005-08-09
2009-11-10
Nguyen, Dung T. (Department: 2871)
Liquid crystal cells, elements and systems
Particular structure
Having significant detail of cell structure only
C349S149000
Reexamination Certificate
active
07616273
ABSTRACT:
There is disclosed a contact structure for electrically connecting conducting lines formed on a first substrate of an electrooptical device such as a liquid crystal display with conducting lines formed on a second substrate via conducting spacers while assuring a uniform cell gap among different cells if the interlayer dielectric film thickness is nonuniform across the cell or among different cells. A first conducting film and a dielectric film are deposited on the first substrate. Openings are formed in the dielectric film. A second conducting film covers the dielectric film left and the openings. The conducting spacers electrically connect the second conducting film over the first substrate with a third conducting film on the second substrate. The cell gap depends only on the size of the spacers, which maintain the cell gap.
REFERENCES:
patent: 3954325 (1976-05-01), Borden
patent: 4231034 (1980-10-01), Bechteler
patent: 4600273 (1986-07-01), Ohno
patent: 4640583 (1987-02-01), Hoshikawa et al.
patent: 5005951 (1991-04-01), Te Velde
patent: 5078475 (1992-01-01), Sekimura et al.
patent: 5132820 (1992-07-01), Someya et al.
patent: 5229644 (1993-07-01), Wakai et al.
patent: 5311342 (1994-05-01), Watanabe
patent: 5331447 (1994-07-01), Someya et al.
patent: 5486941 (1996-01-01), Saiuchi et al.
patent: 5528396 (1996-06-01), Someya et al.
patent: 5532850 (1996-07-01), Someya et al.
patent: 5585951 (1996-12-01), Noda et al.
patent: 5619358 (1997-04-01), Tanaka et al.
patent: 5621556 (1997-04-01), Fulks et al.
patent: 5625474 (1997-04-01), Aomori et al.
patent: 5636329 (1997-06-01), Sukegawa et al.
patent: 5708484 (1998-01-01), Someya et al.
patent: 5742006 (1998-04-01), Grupp et al.
patent: 5757456 (1998-05-01), Yamazaki et al.
patent: 5790212 (1998-08-01), Lim
patent: 5811318 (1998-09-01), Kweon
patent: 5825449 (1998-10-01), Shin
patent: 5828433 (1998-10-01), Shin
patent: 5838399 (1998-11-01), Someya et al.
patent: 5889572 (1999-03-01), Takahashi et al.
patent: 5897188 (1999-04-01), Sasuga et al.
patent: 5929948 (1999-07-01), Ohori et al.
patent: 5946062 (1999-08-01), Hasegawa et al.
patent: 5966594 (1999-10-01), Adachi et al.
patent: 5982471 (1999-11-01), Hirakata et al.
patent: 6124917 (2000-09-01), Fujioka et al.
patent: 6177974 (2001-01-01), Hirakata et al.
patent: 6219124 (2001-04-01), Lee et al.
patent: 6226059 (2001-05-01), Yamamoto et al.
patent: 6384879 (2002-05-01), Someya et al.
patent: 6404476 (2002-06-01), Mase
patent: 6404480 (2002-06-01), Hirataka et al.
patent: 6839098 (2005-01-01), Someya et al.
patent: 6992744 (2006-01-01), Someya et al.
patent: 7196762 (2007-03-01), Someya et al.
patent: 2003/0210357 (2003-11-01), Hirakata et al.
patent: 2006/0268212 (2006-11-01), Someya et al.
patent: 50-109696 (1975-08-01), None
patent: 58-100383 (1983-07-01), None
patent: 58-182685 (1983-10-01), None
patent: 62-204232 (1987-09-01), None
patent: 62-218937 (1987-09-01), None
patent: 01-169430 (1989-07-01), None
patent: 02-000921 (1990-01-01), None
patent: 02-302730 (1990-12-01), None
patent: 03-058024 (1991-03-01), None
patent: 04-083227 (1992-03-01), None
patent: 04-095928 (1992-03-01), None
patent: 04-194910 (1992-07-01), None
patent: 04-350626 (1992-12-01), None
patent: 05-066410 (1993-03-01), None
patent: 05-241183 (1993-09-01), None
patent: 5-241183 (1993-09-01), None
patent: 5-243333 (1993-09-01), None
patent: 05-243333 (1993-09-01), None
patent: 06-148678 (1994-05-01), None
patent: 06-186579 (1994-07-01), None
patent: 06-250221 (1994-09-01), None
patent: 06-289415 (1994-10-01), None
patent: 6-289415 (1994-10-01), None
patent: 06-308510 (1994-11-01), None
patent: 6-308510 (1994-11-01), None
patent: 07-199209 (1995-08-01), None
patent: 07-248506 (1995-09-01), None
patent: 07-294944 (1995-11-01), None
patent: 07-301815 (1995-11-01), None
patent: 08-022015 (1996-01-01), None
patent: 8-250745 (1996-09-01), None
patent: 08-250745 (1996-09-01), None
patent: 8-254686 (1996-10-01), None
patent: 08-254686 (1996-10-01), None
patent: 09-033933 (1997-02-01), None
patent: 09-244055 (1997-09-01), None
patent: WO 97/06458 (1997-02-01), None
patent: WO 97/10530 (1997-03-01), None
Request for Ex Parte Reexamination of U.S. Patent No. 6,404,480 to Hirakata et al.
Order Granting Ex Parte Reexamination dated May 12, 2006 for U.S. Appl. No. 90/007,985.
Official Action dated Aug. 10, 2004 for U.S. Appl. No. 10/453,684.
Acer Incorporated and Acer America Corporation's Preliminary Proposed Constructions of Identified Claim Terms (Dated: Jan. 27, 2003).
Preliminary Proposed Construction of Identified Claim Terms by AU Optronics Corporation (Dated: Jan. 27, 2003).
SEL's Proposed Preliminary Claim Constructions and Extrinsic Evidence (Jan. 27, 2003).
Joint Claim Construction and Prehearing Statement (Dated: Feb. 3, 2003).
Preliminary Invalidity Contentions of Acer Incorporated, Acer America Corporation, and AU Optronics Corporation.
Plaintiff, Semiconductor Energy Laboratory Co., Ltd., Complaint for Patent Infringement, Demand for Jury Trial, and Certification of Interested Parties Dated Nov. 3, 2004.
Defendant Chi Mei Optoelectronics Corp.'s Answer to Complaint for Patent Infringement, Demand for Jury Trial, Counterclaim, and Certification of Interested Parties Dated Feb. 28, 2005.
Defendant Westinghouse Digital Electronics, LLC's Answer to Complaint for Patent Infringement, and Certification of Interested Parties Dated Feb. 28, 2005.
Defendant International Display Technology Co., Ltd.'s Answer to Complaint for Patent Infringement, and Certification of Interested Parties Dated Feb. 28, 2005.
Defendant International Display Technology USA, Inc.'s Answer to Complaint, and Certification of Interested Parties Dated Feb. 28, 2005.
Defendant Chi Mei Optoelectronics Corp.'s Responses to Plaintiff Semiconductor Energy Laboratory Co., Ltd.'s First Set of Interrogatories Dated Apr. 4, 2005.
Acer lncorporated's Answer to First Amended Complaint for Patent Infringement and Counterclaims in Case No. C 02-02800 WHA.
Acer America Corporation's Answer to First Amended Complaint for Patent Infringement and Counterclaims in Case No. C 02-02800 WHA.
AU Optronics Corporation's Answer to First Amended Complaint for Patent Infringement and Counterclaims in Case No. C 02-02800 WHA.
Official Action dated Dec. 19, 2003 for U.S. Appl. No. 10/453,684.
Expert Witness Report of Richard A. Killworth of May 22, 2003.
Reference 1 of Expert Witness Report of Richard A. Killworth, U.S. Patent No. 6,355,941.
Reference 2 of Expert Witness Report of Richard A. Killworth. May 1, 2003 Yamazaki Deposition Transcript (pp. 141-150).
Reference 3 of Expert Witness Report of Richard A. Killworth, Yamazaki Deposition Exhibit 9.
Reference 4 of Expert Witness Report of Richard A. Killworth, Yamazaki Deposition Exhibit 10.
Reference 5 of Expert Witness Report of Richard A. Killworth, Apr. 30, 2003 Yamazaki Deposition Transcript (pp. 80-81).
References 6 of Expert Witness Report of Richard A. Killworth, Information Disclosure Statement (SEL 00962-SEL 00963) and PTO Form 1449 (SEL 00963).
Reference 7 of Expert Witness Report of Richard A. Killworth, Jul. 16, 1999 Office Action (SEL 00978-SEL 00979).
Reference 8 of Expert Witness Report of Richard A. Killworth, May 14, 2003 Robinson Deposition Transcript (pp. 29-58).
Reference 9 of Expert Witness Report of Richard A. Killworth, PTO Appeal Brief (SEL 00891-SEL 00908).
Reference 10 of Expert Witness Report of Richard A. Killworth, PTO Board Ruling (SEL 00999).
Reference 11 of Expert Witness Report of Richard A. Killworth, Oct. 10, 1995 Supplemental Information Disclosure Statement (SEL 00683-SEL 00692).
Reference 12 of Expert Witness Report of Richard A. Killworth, Partial Translation of National Convention Record (SEL 59441).
Reference 13 of Expert Witness Report of Richard A. Killworth, U.S. Patent No. 6,404,480.
Reference 14 of Expert Witness Report of Richard A. Killworth, May 15, 2003 Hirakata Deposition Transcript (p. 41).
Exhibit 1 of Expert Witness Report of Richard A. Killworth, Curriculum Vitae.
Exhibit 2 of Expert Witness Report of Richard A. Killworth, Illustration of Violation of the Best
Hirakata Yoshiharu
Yamazaki Shunpei
Nguyen Dung T.
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
LandOfFree
Contact structure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Contact structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact structure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4138324