Contact spring and socket combination for high bandwidth...

Details Contact spring and socket combination for high bandwidth... Contact spring and socket combination for high bandwidth...

2007-06-19

2007-06-19

Arbes, Carl J. (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S595000, C029S857000, C324S072500, C324S754090

Reexamination Certificate

active

11131779

ABSTRACT:
A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.

REFERENCES:
patent: 6688906 (2004-02-01), Kimbley
patent: 6911811 (2005-06-01), Cannon
patent: 2003/0173944 (2003-09-01), Cannon
patent: 2003/0224641 (2003-12-01), Kimbley

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