Contact spring and socket combination for high bandwidth...

Details Contact spring and socket combination for high bandwidth... Contact spring and socket combination for high bandwidth...

2005-06-28

2005-06-28

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

C324S754090, C324S757020

Reexamination Certificate

active

06911811

ABSTRACT:
A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.

REFERENCES:
patent: 5477159 (1995-12-01), Hamling
patent: 6034534 (2000-03-01), Kiyota
patent: 6043666 (2000-03-01), Kazama
patent: 6246245 (2001-06-01), Akram et al.
patent: 6551126 (2003-04-01), Feldman
patent: 6573738 (2003-06-01), Matsuo et al.

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