Contact probe, probe socket, electrical characteristic...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07116123

ABSTRACT:
A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.

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patent: 2004/0246014 (2004-12-01), Goto
patent: 290182 (1988-11-01), None
patent: 07012846 (1995-01-01), None
patent: 09072932 (1997-03-01), None
patent: 2001-201515 (2001-07-01), None

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