Contact probe, measuring pad used for the contact probe, and...

Details Contact probe, measuring pad used for the contact probe, and... Contact probe, measuring pad used for the contact probe, and...

2007-04-24

2007-04-24

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

11136572

ABSTRACT:
There is provided a contact probe that is smaller than 50 μm in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode10aand a ground electrode11athat are put into contact with an object to be measured; and a coaxial cable1having a core1belectrically connected to the signal electrode10aand an outer covering conductor1aelectrically connected to the ground electrode1a, wherein the tip member is formed on a printed wiring board2, and wherein the signal electrode10aand the ground electrode11aare constructed of fine coplanar strip lines formed on an insulating board2a.

REFERENCES:
patent: 4116523 (1978-09-01), Coberly et al.
patent: 5194932 (1993-03-01), Kurisu
patent: 5270664 (1993-12-01), McMurtry et al.
patent: 5506515 (1996-04-01), Godshalk et al.
patent: 6310483 (2001-10-01), Taura et al.
patent: 2001/0038294 (2001-11-01), Matsunaga et al.
patent: 2005/0236717 (2005-10-01), Aoyagi et al.
Katsuya Kikuchi et al., “Fabrication of High-Density Wiring Interposer for . . . ” Japanese Journal of Applied Physics, vol. 43, No. 7A, pp. 4141-4145, 2004.
Katsuya Kikuchi et al., “Fabrication of High-Density Wiring Interposer for . . . ” Extended Abstracts of the 2003 International Conference on Solid State Devices and Materials, pp. 382-383.

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