Contact probe for a testing head having vertical probes for...

Details Contact probe for a testing head having vertical probes for... Contact probe for a testing head having vertical probes for...

2007-11-27

2007-11-27

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

10963985

ABSTRACT:
A contact probe for a testing head is presented. The contact probe for a testing head has a plurality of these probes which are inserted in guide holes realized in respective dies, the probe comprising a rod-shaped body equipped at an end with at least a contact tip effective to ensure the mechanical and electrical contact with a corresponding contact pad of an integrated electronic device to be tested. The rod-shaped body has a nonuniform cross section.

REFERENCES:
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 5952843 (1999-09-01), Vinh
patent: 6300783 (2001-10-01), Okubo et al.
patent: 6459287 (2002-10-01), Nightingale et al.
patent: 6507207 (2003-01-01), Nguyen
patent: 6847221 (2005-01-01), Kimoto et al.
patent: 6853208 (2005-02-01), Okubo et al.
patent: 2001/0031575 (2001-10-01), Jurine et al.
patent: 2002/0105347 (2002-08-01), Maruyama et al.
patent: 2002/0113612 (2002-08-01), Nguyen
patent: 1 197 756 (2002-04-01), None
patent: 2 535 064 (1984-04-01), None

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