Contact probe assembly having rotatable contacting probe element

Details Contact probe assembly having rotatable contacting probe element Contact probe assembly having rotatable contacting probe element

1981-03-20

1983-12-27

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 106, G01R 3102

Patent

active

044233760

ABSTRACT:
An electrical probe assembly with rotatable probe elements for establishing electrical contact to pad surfaces having a plurality of elongated probe elements formed of a conductive flexible material, each having a length many times its diameter, spaced upper and lower flat support elements having apertures receiving the ends of the probe elements and maintaining the probe elements in a generally parallel arrangement with at least the lower ends in a configuration corresponding to the pad configuration to be contacted, and a means to simultaneously rotate the probe elements.

REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 4027935 (1977-06-01), Byrnes et al.
Dombroski et al., "Floating Bias . . . ", IBM Tech. Dis. Bull.; vol. 18; No. 4; pp. 1038-1039, Sep. 1975.
Clerx, P. P.; "Mechanical Aspects . . . "; Solid State Technology; Jun. 1969; pp. 6, 69, 70.
IBM TDB, vol. 18, No. 5, Oct. 1975, p. 1378.
IBM TDB, vol. 12, No. 4, Sep. 1969, p. 551.

Affiliated with

Also associated with

Rating

Contact probe assembly having rotatable contacting probe element does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contact probe assembly having rotatable contacting probe element, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact probe assembly having rotatable contacting probe element will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-949930