Contact probe arrangement for functional electrical testing

Details Contact probe arrangement for functional electrical testing Contact probe arrangement for functional electrical testing

1997-03-24

1999-08-17

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, 324757, G01R 1073

Patent

active

059398930

ABSTRACT:
A contact probe arrangement for electrical functional testing, including a first stack of perforated plates, a second stack of perforated plates and a plurality of contact probes. The probes are in contact with the second stack of perforated plates, and in communication with the first stack, the probes are arranged and dimensioned such that the probes are capable of lateral buckling and capable of being guided through the first stack. The contact probe arrangement also includes a test card, a counterholding piece attached to the test card, and a pressure plate, the pressure plate movably connected to the test card. The first perforated plate is connected to the second perforated plate such that the first perforated plate is capable of movement toward and away from the second perforated plate and the second perforated plate is connected to the first perforated plate such that the second perforated plate is capable of movement toward and away from the first perforated plate.

REFERENCES:
patent: 4622514 (1986-11-01), Lewis
patent: 4843315 (1989-06-01), Bayer et al.
patent: 5488314 (1996-01-01), Brandt et al.
patent: 5818248 (1998-10-01), St. Onge

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