Contact probe apparatus used in electric tests for a circuit boa

Details Contact probe apparatus used in electric tests for a circuit boa Contact probe apparatus used in electric tests for a circuit boa

1997-04-14

1998-03-24

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, 324754, 439824, G01R 3102

Patent

active

057317100

ABSTRACT:
A test probe contact comprises a plunger 1 having a pointed tip 4 formed into a pyramid configuration having an apex 9 and a plurality of slant faces 10--10 meeting at the apex 9 so as to form a ridge 8 between adjacent two slant faces 10 and 10. The pointed tip 4 is connectable with a check land 11 of a test member. A barrel 2 holds the plunger 1 therein so that the plunger 1 slides in an axial direction thereof. A sliding movement of the plunger 1 causes the ridge 8 of the pointed tip 4 to cut the surface of the check land 11 along a ridgeline of the ridge 8. A spring 3 resiliently supports the plunger 1 in the axial direction of the plunger 1 for giving an elastic reaction force to the plunger 1 when plunger 1 is pushed against the check land 11, thereby breaking through the surface of the check land 11 by the ridge 8 so as to establish an electrical connection between the pointed tip 4 and the metal portion of the check land 11.

REFERENCES:
patent: 4307928 (1981-12-01), Petlock, Jr.
patent: 4686465 (1987-08-01), Kruger
patent: 4885533 (1989-12-01), Coe
patent: 5009613 (1991-04-01), Langgard et al.
patent: 5032787 (1991-07-01), Johnston, et al.

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