Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-03-13
2007-03-13
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
10472571
ABSTRACT:
A contact probe is fabricated by forming a resin mold with a cavity on a substrate having conductivity, and filling the cavity with metal through electroforming. The metal includes a cobalt-tungsten alloy. Alternatively, a cobalt-molybdenum alloy may be used instead of the cobalt-tungsten alloy. Alternatively, a contact probe can be made from nickel, cobalt or copper, and have a coat film of cobalt-tungsten alloy or cobalt-molybdenum alloy formed thereon to increase the abrasion resistance. A nickel-molybdenum alloy can be used instead of the cobalt-tungsten alloy or cobalt-molybdenum alloy.
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U.S. Appl. No. 09/604,463; pp. 1 to 44, 6 sheets of drawings.
T. Haga et al.: “Development of micro contact probe” Sei Tekunikaru Rebyuu, No. 161, Sep. 2002, pp. 87-90, XP009052004, Amsterdam Holland (with English Abstract).
Y. Hirata; “LIGA process—micromachining technique using synchrotron radiation lithography—and some industrial applications” Nuclear Instruments and Methods in Physics Research, Section -B 208: Beam Interactions with Materials and Atoms, Aug. 2003, pp. 21-26, XP004438693, Japan (in English).
Haga Tsuyoshi
Okada Kazunori
Fasse W. F.
Fasse W. G.
Nguyen Ha Tran
Nguyen Trung Q.
Sumitomo Electric Industries Ltd.
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