Contact position sensor using constant contact force control sys

Geometrical instruments – Gauge – Movable contact probe – per se

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Details

33561, 364559, G01B 728

Patent

active

054149401

ABSTRACT:
A force control system (50) and method are provided for controlling a position contact sensor (10) so as to produce a constant controlled contact force therewith. The system (50) includes a contact position sensor (10) which has a contact probe (12) for contacting the surface of a target to be measured and an output signal (V.sub.o) for providing a position indication thereof. An actuator (30) is provided for controllably driving the contact position sensor (10) in response to an actuation control signal (I). A controller (52) receives the position indication signal (V.sub.o) and generates in response thereto the actuation control signal (I) so as to provide a substantially constant selective force (F) exerted by the contact probe (12). The actuation drive signal (I) is generated further in response to substantially linear approximation curves based on predetermined force and position data attained from the sensor (10) and the actuator (30).

REFERENCES:
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patent: 4490913 (1985-01-01), Vis
patent: 4492034 (1985-01-01), Nishina et al.
patent: 4621434 (1986-11-01), Hirschmann
patent: 4873771 (1989-10-01), Wust
patent: 5012591 (1991-05-01), Asakawa
patent: 5018278 (1991-05-01), Aehnelt et al.
patent: 5105554 (1992-04-01), Schnyder et al.
patent: 5136789 (1992-08-01), Burton

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