Radiation imagery chemistry: process – composition – or product th – Effecting frontal radiation modification during exposure,...
Reexamination Certificate
2011-04-26
2011-04-26
Chacko-Davis, Daborah (Department: 1722)
Radiation imagery chemistry: process, composition, or product th
Effecting frontal radiation modification during exposure,...
C430S311000, C250S492200, C250S492220
Reexamination Certificate
active
07932020
ABSTRACT:
Improvements in the fabrication of integrated circuits are driven by the decrease of the size of the features printed on the wafers. Current lithography techniques limits have been extended through the use of phase-shifting masks, off-axis illumination, and proximity effect correction. More recently, liquid immersion lithography has been proposed as a way to extend even further the limits of optical lithography. This invention described a methodology based on contact or proximity printing using a projection lens to define the image of the mask onto the wafer. As the imaging is performed in a solid material, larger refractive indices can be obtained and the resolution of the imaging system can be increased.
REFERENCES:
patent: 5121256 (1992-06-01), Corle et al.
patent: 5469299 (1995-11-01), Nagano
patent: 5982558 (1999-11-01), Further et al.
patent: 6198576 (2001-03-01), Matsuyama
patent: 6522484 (2003-02-01), Schuster
French, Roger H., et al., “Fluoropolymers for 157nm Lithography: Optical Properties from VUV Absorbance and Ellipsometry Measurements,” SPIE Proceedings, Microlithography 2000, 12 pages.
Flagello, Donis G., et al., “High-numerical-aperture eefects in photoresist,” Applied Optics 36(34) (Dec. 1, 1997) 8944-8951.
French, Roger H., et al., “Materials Design and Development of Fluoropolymers for Use as Pellicles in 157nm Photolithography,” Optical Microlithography XIV, Proceedings of SPIE vol. 4346 (2001).
Pierrat, Christophe, et al., “The MEF Revisited: Low k1 Effects versus Mask Topography Effects,” Optical Microlithography XVI, Proceedings of SPIE vol. 5040 (Feb. 25, 2003).
Chiba, Yuji, et al., “New generation projection optics for ArF lithography,” Optical Microlithography XV, Proceedings of SPIE vol. 4691 (2002), 679-686.
Baek, So-Yeon, et al., “Simulation Study of Process Latitude for Liquid Immersion Lithography,” Optical Microlithography XVI, Proceedings of SPIE vol. 5040 (Feb. 27, 2003), 11 pages.
Pendry, J.B., et al., “Near-field lenses in two dimensions,” J. Phys.: Condens. Matter 14 (2002) 8463-8479.
Ober, Christopher K., “Polymer Surfaces and Surface Analysis,” Nanobiotechnology MSE 563/AEP 663 (2000), 43 pages.
Hafeman, Scott, et al, “Simulation of imaging and stray light effects in immersion lithography,” Optical Microlithography XVI, Proceedings of SPIE vol. 5040 (Feb. 27, 2003), 13 pages.
Pierrat Christophe
Wong Alfred K.
Chacko-Davis Daborah
Hall Estill
Milks, III William C.
Takumi Technology Corporation
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