Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-05-11
1992-03-03
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324683, 324690, 324709, G01R 2702, G01R 2726
Patent
active
050936263
ABSTRACT:
An electrical device for measuring the dry film thickness of a paint film applied to a conductive coating adhered to a plastic substrate without destroying the film; the device contains the followintg components: a. an electric sensing device of two separate electrodes isolated from each other and positioned in a material capable of conforming to the surface of the film being measured where the sensing device is placed in contact with the surface of the film and measured under a uniform and reproducible pressure; b. a gain and phase measuring device electrically connected to the sensing device for measuring the gain and phase of an alternating current electrical signal passed from one electrode through the film and conductive coating to the second electrode; c. a device electrically associated with the gain and phase measuring device which measures the gain and phase signals of the overall circuit of the two electrodes, the paint film and conductive coating and from the gain and phase signals calculates the thickness of the paint film and the resistance of the conductive coating.
REFERENCES:
patent: 2811691 (1957-10-01), Dahm et al.
patent: 3801900 (1974-04-01), Szasz
patent: 4546310 (1985-10-01), Chatanier et al.
patent: 4682105 (1987-07-01), Thorn
patent: 4881025 (1989-11-01), Gregory
"Measuring Thickness of Coatings on Metals", NASA Tech Briefs, May/Jun. 1986, pp. 94 & 96.
Baer James A.
Falcoff Allan F.
Kremers Jan H.
Young James R.
E. I. DuPont de Nemours and Company
Fricke Hilmar L.
Harvey Jack B.
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