Contact judging circuit and contact judging method for impedance

Communications: electrical – Condition responsive indicating system – Specific condition

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

340661, 340664, 340635, 324133, G08B 2100

Patent

active

054164702

ABSTRACT:
The contact between a device under test (DUT) and a measuring terminal is accurately judged with a simple circuit for impedance measurement. The conduction detecting means injects a judging current into the voltage terminal (L.sub.P) for low voltage. When the device under test (DUT) and both the current terminal (L.sub.C) for low voltage and the voltage terminal (L.sub.P) for low voltage are normally contacted with each other, since the inverting input terminal of the inverting amplifier is virtually grounded, and the L.sub.C and L.sub.P are substantially kept at the ground potential, the contact judgment for L.sub.C and L.sub.P is made by detecting the potentials of L.sub.P. In addition, when the impedance measurement value is larger than the predetermined lowest limit value and the current measurement value is lower than the predetermined lowest limit value, the DUT and the current terminal (H.sub.C) for high voltage are considered to have improper contact with each other. When the current measurement value is larger than the predetermined lowest limit value, and the impedance measurement value is lower than the predetermined lowest limit value, the DUT and the voltage terminal (H.sub.P) for high voltage are considered to have improper contact with each other.

REFERENCES:
patent: 4636721 (1987-01-01), Howell et al.
Hewlett-Packard 4278A 1kHz/1MHz Capacitance Meter Operation Manual, Yokogawa-Hewlett-Packard, Ltd., Copyright 1987, Printed Apr. 1991, pp. 3-21.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Contact judging circuit and contact judging method for impedance does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contact judging circuit and contact judging method for impedance, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact judging circuit and contact judging method for impedance will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-640676

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.