Contact for use in testing integrated circuits

Details Contact for use in testing integrated circuits Contact for use in testing integrated circuits

2007-05-10

2010-06-15

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

07737708

ABSTRACT:
A contact for use in a contact set assembly. The contact spans a space which separates a lead of an integrated circuit to be tested and a pad of a load board interfacing with the tester. The contact construction provides electrical communication between integrated circuit lead and the load board pad. Included is an insulating lamina which comprises, in part, a contact. A conductive lamina overlies at least a portion of the insulating lamina. The laminar construction and size and shape of conductive traces applied to a ceramic lamina enable parameters of the contact to be provided.

REFERENCES:
patent: 3851249 (1974-11-01), Roch
patent: 5061894 (1991-10-01), Ikeda
patent: 5084672 (1992-01-01), Ikeuchi et al.
patent: 6023103 (2000-02-01), Chang et al.
patent: 6166552 (2000-12-01), O'Connell
patent: 6242933 (2001-06-01), Yap
patent: 7088118 (2006-08-01), Liu et al.
patent: 7491069 (2009-02-01), Di Stefano et al.
patent: 2003/0127246 (2003-07-01), Watanabe et al.
patent: 03 041369 (1991-02-01), None
patent: 2000 230938 (2000-08-01), None

Affiliated with

Also associated with

Rating

Contact for use in testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contact for use in testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact for use in testing integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4155271