Contact for electrical test of electronic devices, probe...

Details Contact for electrical test of electronic devices, probe... Contact for electrical test of electronic devices, probe...

2009-04-03

2011-11-22

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754230, C324S762010, C324S755070, C324S754070, C324S755110, C439S482000, C439S824000, C216S011000

Reexamination Certificate

active

08063651

ABSTRACT:
A contact for an electrical test comprises a first area to be bonded to a board, a second area extending in the right-left direction from the lower end portion of the first area, a third area projecting downward from the tip end portion of the second area, and a low light reflective film having lower light reflectance than that of the first area. The third area has a probe tip to be contacted an electrode of an electronic device. The low light reflective film is formed on a surface of at least the bonding part of the first area to the board and its proximity.

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