Contact for a semiconductor light emitting device

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With heterojunction

Reexamination Certificate

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Details

C257S098000, C257S099000, C257SE33067

Reexamination Certificate

active

08076682

ABSTRACT:
A semiconductor structure includes a light emitting layer disposed between an n-type region and a p-type region. A p-electrode is disposed on a portion of the p-type region. The p-electrode includes a reflective first material in direct contact with a first portion of the p-type region and a second material in direct contact with a second portion of the p-type region adjacent to the first portion. The first material and second material are formed in planar layers of substantially the same thickness.

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M. Saka et al. Entitled: “Fabrication of AG Micromaterials by Utilizing Stress-Induced Migration”, Department ofNanomechanics, Graduate School of Engineering, Tohoku University Aoba Jun. 6, 2001, Aramaki, Aoba-ku, Sendai 980-8579, Japan, IEEE, 2nd Electronics SystemIntegration Technology Conference, Greenwich, UK, pp. 507-510.

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