Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2008-12-02
2011-10-11
Dang, Phuc (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257SE21476, C257SE29166, C438S281000, C438S289000
Reexamination Certificate
active
08035191
ABSTRACT:
A contact efuse structure includes a silicon layer and a contact contacting the silicon layer with one end. When a voltage is applied to the contact, a void is formed at the end of the contact, and thus the contact is open. Such structure may be utilized in an efuse device or a read only memory. A method of making a contact efuse device and a method of making a read only memory are also disclosed.
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Shine. Chung, Jiann-Tseng Huang, Paul Chen, Fu-Lung Hsueh, “A 512x8 Electrical Fuse Memory with 15μm2 Cells Using 8-sq Asymmetric Fuse and Core Devices in 90nm CMOS” 2007 Symposium on VLSI Circuits Digest of Technical Papers, Jun. 14, 2007, pp. 74-75, Kyoto, Japan.
Lin San-Fu
Lin Yung-Chang
Shih Hui-Shen
Wu Kuei-Sheng
Dang Phuc
Hsu Winston
Margo Scott
United Microelectronics Corp.
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