Contact drive assembly for use with electronic part test equipme

Geometrical instruments

Patent

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Details

339 75M, 339117P, H01R 13629

Patent

active

043700110

ABSTRACT:
In a contact drive assembly for use with test equipment for testing, for example, an IC element, a movable contact piece is brought into contact with a terminal pin of the IC element to connect it to a measuring circuit. A flexible tube is disposed adjacent the movable contact piece and compressed air is supplied to the flexible tube to inflate it, biasing the movable contact piece to engage with or disengage from the terminal pin.

REFERENCES:
patent: 2975390 (1961-03-01), Cardascia et al.
patent: 2978666 (1961-04-01), McGregor
patent: 3366916 (1968-01-01), Oktay
patent: 3848221 (1974-11-01), Lee, Jr.
IBM Technical Disclosure Bulletin, vol. 10, No. 8, Jan. 1968, pp. 1264-1265, "Thermal Test Socket".

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