Contact device for use in the testing of printed circuits and a

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 725, 339108TP, G01R 106

Patent

active

045609268

ABSTRACT:
The contact device for testing printed circuits comprises a contact head (15) mounted for axial sliding motion in a guide tube (9) against the action of a coiled compression spring housed in the tube, and a seating member (8) carrying the tube and intended to be permanently fitted in an aperture provided in a plate forming part of a machine for testing printed circuits. The guide tube is fixedly secured to one end of the seating member. The spring has one end portion (12) fixedly secured to the guide tube adjacent the seating member and/or to said one end of the seating member, the opposite end portion (16) of the spring being formed with a plurality of mutually contacting turns (17), the outer diameter of the spring turns being less than the inner diameter of the tube. Finally, the contact head is removably secured to the opposite end portion (16) of the spring and is provided to this end with a smooth, cylindrical, retaining end portion (18) formed with a tapering engagement tip (20) and having a diameter very slightly greater than the inner diameter of the turns at the opposite end portion (16) of the spring.

REFERENCES:
patent: 3435168 (1969-03-01), Cooney
patent: 3799168 (1974-03-01), Peters
patent: 4050762 (1977-09-01), Hines et al.
patent: 4438397 (1984-03-01), Katz
A. Till, "Contact Probe," IBM Tech. Disc. Bulletin, vol. 16, No. 10, Mar. 1974, p. 3224.

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