Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-12-17
2009-11-24
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S760020, C324S1540PB
Reexamination Certificate
active
07622936
ABSTRACT:
A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.
REFERENCES:
patent: 6150830 (2000-11-01), Schmid et al.
patent: 6420888 (2002-07-01), Griffin et al.
patent: 6747447 (2004-06-01), Markert et al.
patent: 7164280 (2007-01-01), Bohm
patent: 7339385 (2008-03-01), Takasu et al.
patent: 2005/0264312 (2005-12-01), Bohm et al.
Chinese First Office Action in the parallel case (App. No. CN 2007 10159823.9, issued Aug. 21, 2009).
Böhm Gunther
Weiland Achim
Feinmetall GmbH
Harness & Dickey & Pierce P.L.C.
Nguyen Ha Tran T
Velez Roberto
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