Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate
2007-11-06
2007-11-06
Punnoose, Roy M. (Department: 2886)
Optics: measuring and testing
Document pattern analysis or verification
C235S454000
Reexamination Certificate
active
11115384
ABSTRACT:
A low-cost contact detection sensor and contact detection method for easily detecting a contact by a third party is provided. A contact detection sensor comprises an antireflection structure including structure elements having a predetermined shape which are put in an array periodically at a pitch smaller than a wavelength of visible spectrum; and a substrate including the antireflection structure in at least a part of a surface portion thereof. The antireflection structure distinguishes whether the detection target is contacted by a human body or not based on a change in reflectance which occurs to an area of the detection target contacted by the human body when the detection target is contacted by the human body.
REFERENCES:
patent: 2003/0133098 (2003-07-01), Hoshino et al.
patent: 2003-240904 (2003-08-01), None
patent: 2004-012640 (2004-01-01), None
Hayashi Katsuhiko
Yamagata Michihiro
Yamaguchi Hiroshi
Yamamoto Yoshiharu
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