Stock material or miscellaneous articles – Web or sheet containing structurally defined element or... – Physical dimension specified
Reexamination Certificate
2008-05-20
2008-05-20
Feely, Michael J (Department: 1796)
Stock material or miscellaneous articles
Web or sheet containing structurally defined element or...
Physical dimension specified
C428S446000, C428S447000, C428S448000, C428S450000, C427S097300, C427S098400, C427S402000, C427S458000, C427S466000, C427S472000, C427S532000, C977S932000, C977S943000
Reexamination Certificate
active
07374813
ABSTRACT:
A patterned organic monolayer or multiplayer film self-assembled on a solid substrate, the pattern consisting in a site-defined surface chemical modification non-destructively inscribed in the organic monolayer or multilayer by means of an electrically biased conducting scanning probe device, stamping device and/or liquid metal or metal alloy or any other device that can touch the organic monolayer or multilayer surface and inscribe therein a chemical modification pattern upon application of an electrical bias.
REFERENCES:
patent: 5514501 (1996-05-01), Tarlov
patent: 5922214 (1999-07-01), Liu et al.
patent: 6048623 (2000-04-01), Everhart et al.
patent: 0 481 362 (1992-04-01), None
R. Maoz et al., “‘Constructive Nanolithography’: Inert Monolayers as Patternable Templates for In-Situ Nanofabrication of Metal-Semiconductor-Organic Surface Structures—A Generic Approach”,Advanced Materials, 2000, pp. 725-731, vol. 12, No. 10.
R. Maoz et al., “‘Constructive Nanolithography’: Site-Defined Silver Self-Assembly on Nanoelectrochemically Patterned Monolayer Templates”,Advanced Materials, 2000, pp. 424-429, vol. 12, No. 6.
R. Maoz et al., “Nanoelectrochemical Patterning of Monolayer Surfaces: Toward Spatially Defined Self-Assembly of Nanostructures”,Advanced Materials, 1999, pp. 55-61, vol. 11, No. 1.
F. Keith Perkins et al., “Proximal Probe Study of Self-Assembled Monolayer Resist Materials”,J. Vac. Sci. Technol. B, 1994, pp. 3725-3730, vol. 12, No. 6.
Cohen Sidney R.
Frydman Eli
Maoz Rivka
Sagiv Jacob
Browdy and Neimark
Feely Michael J
Yeda Research and Development Co.
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