Constraint solver to code based test data generation for...

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C717S127000, C717S131000, C717S133000, C717S132000, C717S136000

Reexamination Certificate

active

07861226

ABSTRACT:
The present invention is directed to automatically analyzing software systems for identifying faults or bugs and/or detection of malicious code. In various embodiments, the present invention measures code coverage for high priority invocable program elements, uses a relaxed coverage estimation technique that, instead of guaranteeing which code units will be executed, guarantees that at least a certain number of code units will be executed, determines and solves constraints in code to identify infeasible paths containing one or more selected nodes, determines, for a composite data type, a range of values for each of at least two non-composite data fields, and/or translates, prior to code analysis complex code into simpler code having fewer operators.

REFERENCES:
patent: 6099575 (2000-08-01), Hardin et al.
patent: 7146606 (2006-12-01), Mitchell et al.
patent: 7512912 (2009-03-01), Iyer
patent: 7587636 (2009-09-01), Tillmann et al.
patent: 2009/0199162 (2009-08-01), Choi et al.
Hiralal Agrawal, “Dominators Super Blocks, and Program Coverage”, 1994, ACM publishing.
Bruce Eckel, “thinking in java”, 1998, Prentice Hall.
Debray et al, “Compiler Technique for code Compaction”, Mar. 2000, ACM publishing.
Dov Harel, “A linear time algorithm for finding dominators in flow graphs and related problems”, 1985, ACM publishing.
Tikir et al, “efficient instrumentation for code coverage testing”, 2002, ACM publishing.
Gupta, “generalized dominators and post-dominators”, 1992 ACM publishing.
Kazi et al, “Techniques for obtaining high performance in Java programs”, 2001 ACM publishings.
“Integer Security, Lnear the root causes of software vulnerablilites and how to avoid it”, http://www.codeguru.com/cpp/sample—chapter/article.php/c11111/, Dec. 15, 2005.
Kevin Harris, “cpp—random—number.cpp”. http://www.codesampler.com/miscsrc.htm, section random number generator, Sep. 25, 2004.
Kone, O. and Castanet, R.; “Test Generation for Interworking Systems”; Computer Communications; Mar. 13, 2000; pp. 642-652 (Abstract Only); vol. 23, Issue 7.
Malaiya, Y., et al.; “Software Reliability Growth With Test Coverage”; IEEE Transactions on Reliability; Dec. 2002; pp. 420-427; vol. 51, No. 4.
Agrawal, H., et al.; “Mining System Tests to Aid Software Maintenance”; IEEE Computer; Jul. 1998; pp. 64-73; vol. 31, No. 7.
Trew, T.; “What Design Policies Must Testers Demand From Product Line Architects?”; International Workshop on Software Product Line Testing; pp. 51-57.
Chatterjee, R. and Ryder, B.; “Data-Flow-Based Testing of Object-Oriented Libraries”; Department of Computer Science, Rutgers University, No. DCS-TR-382; Mar. 1999.
Agrawal, H.; “Dominators, Super Blocks, and Program Coverage”; Proceedings of the 21st Symposium on Principles of Programming Languages; Jan. 1994; pp. 25-34; Portland, OR.
Jeng, B. and Weyuker, E.; “A Simplified Domain-Testing Strategy”; ACM Transactions on Software Engineering and Methodology; Jul. 1994; pp. 254-270; vol. 3, No. 3.
Zeng, Z. and Ciesielski, M., and Rouzeyre, B.; “Functional Test Generation Using Constraint Logic Programming”; Proceedings of the 11th IFIP International Conference on Very Large Scale Integration—the Global System on Chip Design & CAD Conference; Dec. 2001; pp. 375-387; Montpellier, France.
Demillo, R. and Offutt, A.; “Constraint-Based Automatic Test Data Generation”; IEEE Transactions on Software Engineering; Sep. 1991; pp. 900-910; vol. 17, No. 9.
Gu, Z., and Cheng, K.; “The Derivation of Test Cases from SDL Specifications”; Proceedings of the ACM 30th Annual Southeast Conference; Apr. 8-10, 1992; 219-227; Raleigh, NC.
King, J.; “Symbolic Execution and Program Testing”; Communications of the ACM; Jul. 1976; pp. 385-394 (Abstract Only); vol. 19, Issue 7.
Cohen, D., et al.; “The Combinatorial Design Approach to Automatic Test Generation”; IEEE Software; Sep. 1996; pp. 83-87; vol. 13, No. 5.
Cohen, D., et al.; “The AETG System: An Approach to Testing Based on Combinatorial Design”; IEEE Transactions on Software Engineering; Jul. 1997; pp. 437-444 (Abstract Only); vol. 23, No. 7.
Edvardsson, J.; “A Survey on Automatic Test Data Generation”; Proceedings of the Second Conference on Computer Science and Engineering; Oct. 1999; pp. 21-28; Linkoping, Sweden.
Hartmann, J., Imoberdorf, C., and Meisinger, M.; “UML-Based Integration Testing”; Proceedings of ACM SIGSOFT International Symposium on Software Testing & Analysis; Aug. 2000; pp. 60-70; Portland, OR.
Luo, G., Das, A., and Bochmann, G.; “Software Testing Based on SDL Specifications with Save”; IEEE Transactions on Software Engineering; Jan. 1994; pp. 72-87 (Abstract Only); vol. 20, No. 1.
Kim, Y., et al.; “Test Cases Generation from UML State Diagrams”; IEE Proceedings—Software; Aug. 1999; pp. 187-192; vol. 146, No. 4.
Korel, B.; “Automated Software Test Data Generation”; IEEE Transactions on Software Engineering; Aug. 1990; pp. 870-879 (Abstract Only); vol. 16, No. 8.
Kovacs, G., Pap, Z., and Csopaki, G.; “Automatic Test Selection Based on CEFSM Specifications”; Acta Cybemetica; Dec. 2002; pp. 583-599 (Abstract Only); vol. 15, Issue 4.
Li, J., and Wong, W.; “Automatic Test Generation from Communicating Extended Finite State Machine (CEFSM)-Based Models”; Proceedings of the Fifth IEEE International Symposium on Object-Oriented Real-Time Distributed Computing (ISORC); Apr.-May 2002; pp. 181-185 (Abstract Only); Washington, DC.
Scheetz, M., et al.; “Generating Goal-Oriented Test Cases”; Proceedings of the 23rd Annual International Computer Software and Applications Conference; Oct. 1999; pp. 110-115; Phoenix, AZ.
Michael, C. and McGraw, G.; “Automated Software Test Data Generation for Complex Programs”; Proceedings of the 13th IEEE International Conference on Automated Software Engineering; Oct. 1998; pp. 136-146, Honolulu, HI.
Michael, C., et al.; “Genetic Algorithms for Dynamic Test Data Generation”; Proceedings of the 12th IEEE International Conference on Automated Software Engineering; Nov. 1997; pp. 307-308; Incline Village, NV.
Offutt, J. and Abdurazik, A.; “Generating Tests from UML Specifications”; Proceedings of the Second International Conference on the Unified Modeling Language; Oct. 1999; pp. 416-429; Fort Collins, CO.
Tran Sy, N. and Deville, Y.; “Automatic Test Generation for Programs with Integer and Float Variables”; Proceedings of the 16th IEEE International Conference on Automated Software Engineering; Nov. 2001; p. 13 (Abstract Only); San Diego, CA.
Tran Sy, N. and Deville, Y.; “Consistency Techniques for Interprocedural Test Data Generation”; Proceedings of the Ninth European Software Engineering Conference and ACM SIGSOFT Symposium on the Foundations of Software Engineering; Sep. 2003; pp. 108-117; Helsinki, Finland.
Tsai, W., et al.; “Adaptive Scenario-Based Testing Using UML”; Object Management Group's Third Workshop on UML for Enterprise Applications; Oct. 2002; San Francisco, CA.
Henniger, O. and Ural, H.; “Test Generation Based on Control and Data Dependencies Within Multi-Process SDL Specifications”; Computer Communications; Mar. 2000; pp. 609-627; vol. 23, Issue 7.
Wong, W., Lei, Y., and Ma, X.; “Effective Generation of Test Sequences for Structural Testing of Concurrent Programs”; Proceedings of the Tenth IEEE International Conference on Engineering of Complex Computer Systems; Jun. 2005; pp. 539-548 (Abstract Only); Shanghai, China.
Wong, W.; “Coverage Testing Software Architectural Design in SDL”; Computer Networks: The International Journal of Computer and Telecommunications Networking; Jun. 2003; pp. 35

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Constraint solver to code based test data generation for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Constraint solver to code based test data generation for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Constraint solver to code based test data generation for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4212158

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.