Thermal measuring and testing – Temperature measurement
Patent
1994-11-07
1997-02-18
Chilcot, Richard
Thermal measuring and testing
Temperature measurement
364557, 374141, G02F 1015, G01K 120
Patent
active
056035705
ABSTRACT:
The temperature control of a device incorporated in a module is performed using a device temperature and a surroundings temperature of the device. The device temperature is detected by a device temperature sensor disposed near the device and the surroundings temperature is detected by a surroundings temperature sensor disposed on the module. Using the surroundings temperature when the device is operated, an actual temperature difference between the device temperature and a predetermined control target temperature is estimated based on a predetermined relation between the surroundings temperature and the device temperature detected when desired characteristics of the device are obtained. The device temperature detected when the device is operated is compensated with the estimated temperature difference to adjust the temperature of the device on the predetermined control target temperature.
REFERENCES:
patent: 4058744 (1977-11-01), Dano et al.
patent: 4238759 (1980-12-01), Hunsperger
patent: 4409662 (1983-10-01), Rao
patent: 4658081 (1987-08-01), Richman
patent: 4716551 (1987-12-01), Inagaki
Amrozowicz Paul D.
Chilcot Richard
NEC Corporation
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