Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1991-09-05
1993-06-01
Myracle, Jerry W.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
324721, G01B 718
Patent
active
052149625
ABSTRACT:
A dynamic strain measurement circuit includes a constant resistance conditioner. The constant resistance conditioner compensates for changes in lead wire resistance due to temperature. The conditioner includes adjustable resistance connected between a voltage supply and the strain gage. A potential difference is detected in the circuit and compared to a reference potential. Differences between the reference potential and the detected potential produce an error signal which is used to drive the control of the resistance value of the adjustable resistance in the measurement circuit.
REFERENCES:
patent: 2844775 (1958-07-01), Miller et al.
patent: 3294943 (1966-12-01), Lorenz et al.
Myracle Jerry W.
Sverdrup Technology, Inc.
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