Optics: measuring and testing – With plural diverse test or art
Patent
1976-06-21
1977-12-13
Corbin, John K.
Optics: measuring and testing
With plural diverse test or art
324 64, 324158D, G01N 2122, G01R 2114, G01R 1900
Patent
active
040626326
ABSTRACT:
Described is a technique for generating directly certain derivatives of device parameters by measuring the device response to ac modulation under conditions of constant modulation index. In particular, the technique as it applies to measuring directly idF/di and i.sup.2 d.sup.2 F/di.sup.2 for AlGaAs DH p-n junction lasers is described for two cases: where the generalized function F equals either voltage V across the laser or the light intensity output L of the laser, and i equals current through the laser. For p-n junction lasers this technique permits measurement of the series resistance R.sub.s, lasing current threshold i.sub.th and the exponential factor .beta. = q
kT.
REFERENCES:
eliseev et al., "Investigation of DC Junction Lasers" Physics of P-N Junctions & Semiconductor Devices, Edited by Y. V. Shmartsev (1971), pp. 150-159.
Mikkor et al., "Phonon & Plasmon Interactions in Metal-Semiconductor Tunneling Junctions" Phys. Rev. B, vol. 2, No. 6, 9-15-70, pp. 1875-1887.
Bell Telephone Laboratories Incorporated
Corbin John K.
Punter Wm. H.
Urbano Michael J.
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