Constant modulation index technique for measuring the derivative

Details Constant modulation index technique for measuring the derivative Constant modulation index technique for measuring the derivative

1976-06-21

1977-12-13

Corbin, John K.

Optics: measuring and testing

With plural diverse test or art

324 64, 324158D, G01N 2122, G01R 2114, G01R 1900

Patent

active

040626326

ABSTRACT:
Described is a technique for generating directly certain derivatives of device parameters by measuring the device response to ac modulation under conditions of constant modulation index. In particular, the technique as it applies to measuring directly idF/di and i.sup.2 d.sup.2 F/di.sup.2 for AlGaAs DH p-n junction lasers is described for two cases: where the generalized function F equals either voltage V across the laser or the light intensity output L of the laser, and i equals current through the laser. For p-n junction lasers this technique permits measurement of the series resistance R.sub.s, lasing current threshold i.sub.th and the exponential factor .beta. = q
kT.

REFERENCES:
eliseev et al., "Investigation of DC Junction Lasers" Physics of P-N Junctions & Semiconductor Devices, Edited by Y. V. Shmartsev (1971), pp. 150-159.
Mikkor et al., "Phonon & Plasmon Interactions in Metal-Semiconductor Tunneling Junctions" Phys. Rev. B, vol. 2, No. 6, 9-15-70, pp. 1875-1887.

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