Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-11-09
1992-07-07
Strecker, Gerard R.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324 79D, 377 20, G01R 2302
Patent
active
051286076
ABSTRACT:
A method and apparatus makes rapid frequency measurements by measuring time intervals for a series of blocks of event counts with the number of events in each block held constant. This makes the numerator of the events/time relationship constant so it does not have to be measured, processed or stored. The frequency of the signal is determined by measuring the time interval, then taking the inverse of the measured value and multiplying by the appropriate constant. A fast inverse circuit uses a Taylor series expansion technique implemented in digital circuit, with the slope resolution adjusted for regions of small slope to improve accuracy.
REFERENCES:
patent: 3991365 (1976-11-01), Takeuchi
patent: 4257005 (1981-03-01), Hall
patent: 4544884 (1985-10-01), Hayashi
patent: 4624005 (1986-11-01), Tachino
patent: 4707653 (1987-11-01), Wagner
patent: 4786861 (1988-11-01), Hulsing
Chu David
Clark David W.
Davis Alan
Ferguson Keith M.
Hewlett--Packard Company
Solis Jose M.
Strecker Gerard R.
Williams James M.
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