Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1993-02-16
1994-12-06
Strecker, Gerard R.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324706, 324713, 324601, 324130, 73862628, G01R 2702, G01L 122, G01K 720
Patent
active
053714695
ABSTRACT:
A constant current loop measuring system is provided for measuring a characteristic of an environment. The system comprises a first impedance positionable in the environment, a second impedance coupled in series with said first impedance and a parasitic impedance electrically coupled to the first and second impedances. A current generating device, electrically coupled in series with the first and second impedances, provides a constant current through the first and second impedances to produce first and second voltages across the first and second impedances, respectively, and a parasitic voltage across the parasitic impedance. A high impedance voltage measuring device measures a voltage difference between the first and second voltages independent of the parasitic voltage to produce a characteristic voltage representative of the characteristic of the environment.
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Brekke Darrell G.
Do Diep
Manning John R.
Miller Guy M.
Strecker Gerard R.
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