Connector probing system

Details Connector probing system Connector probing system

2005-06-30

2008-12-09

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S538000, C324S1540PB

Reexamination Certificate

active

07463042

ABSTRACT:
An improved probing system is provided for facilitating the making electrical connections to a variety of connectors. The system can be implemented with a plurality of probes capable of being independently translated and pivoted in a plurality of directions under computer control for contacting portions of an electrical connector under test. Probes of the system can be easily reconfigured to test a plurality of different connector types without requiring the use of custom harnesses. A connector having a plurality of contact portions can be received into a gripping mechanism of the probing system. An image of the connector can be captured by a camera of the system and processed by a computing device. Various probes can be positioned to contact the connector to facilitate the performance of tests on the connector, including the application of voltages and currents to the connector, as well as the detection of the same from the connector.

REFERENCES:
patent: 4115736 (1978-09-01), Tracy
patent: 4751457 (1988-06-01), Veenendaal
patent: 4774462 (1988-09-01), Black
patent: 4820975 (1989-04-01), Diggle
patent: 4970461 (1990-11-01), LePage
patent: 5072185 (1991-12-01), Rockwell
patent: 5122070 (1992-06-01), Lebris et al.
patent: 5467023 (1995-11-01), Takeyama
patent: 5744966 (1998-04-01), Sato
patent: 5777480 (1998-07-01), Hatagishi et al.
patent: 5963027 (1999-10-01), Peters
patent: 6002263 (1999-12-01), Peters et al.
patent: 6137300 (2000-10-01), Hayashida
patent: 6157197 (2000-12-01), Iwasaki
patent: 6208375 (2001-03-01), Kay et al.
patent: 6252392 (2001-06-01), Peters
patent: 6268719 (2001-07-01), Swart
patent: 6285200 (2001-09-01), Pace et al.
patent: 6307389 (2001-10-01), Buks et al.
patent: 6362636 (2002-03-01), Peters et al.
patent: 6377066 (2002-04-01), Bridges et al.
patent: 6396296 (2002-05-01), Tarter et al.
patent: 6480004 (2002-11-01), Iwasaki
patent: 6480005 (2002-11-01), Nagano et al.
patent: 6489789 (2002-12-01), Peters et al.
patent: 6639415 (2003-10-01), Peters et al.
patent: 6661237 (2003-12-01), Teich
patent: 6677773 (2004-01-01), Prokopp
patent: 6717423 (2004-04-01), Thurairajaratnam et al.
patent: 6798227 (2004-09-01), Hwang
patent: 6842260 (2005-01-01), Dietrich et al.
patent: 7015711 (2006-03-01), Rothaug et al.
patent: 7026832 (2006-04-01), Chaya et al.
patent: 7151386 (2006-12-01), Kim
patent: 2003/0001599 (2003-01-01), Craven et al.
patent: 2003/0057959 (2003-03-01), Teich
patent: 2004/0012400 (2004-01-01), Sauk et al.

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