Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1993-11-24
1995-07-11
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
356237, 324501, G01N 2100
Patent
active
054324564
ABSTRACT:
A pin protrusion test fixture includes an element having a void therethrough, structure for biasing the aforementioned element in a first direction to a first position, and structure for directing a pin toward that element so that the pin causes the element to move in a second direction to a second position. The test fixture also includes a light source and a light sensor disposed so that when the element is in the second position, light from the light source passes through the void through the element having a void therethrough and is then detected by the light sensor.
REFERENCES:
patent: 3773426 (1973-11-01), Mudd
patent: 4405233 (1983-09-01), Grau
patent: 4686637 (1987-08-01), Linker
Compaq Computer Corporation
Wardas Mark
Wieder Kenneth A.
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