Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Patent
1991-08-14
1993-04-27
Bradley, Paula A.
Electrical connectors
Preformed panel circuit arrangement, e.g., pcb, icm, dip,...
With provision to conduct electricity from panel circuit to...
439 73, 439493, 439525, 439 77, 439912, 361398, 324158F, H01R 909
Patent
active
052057410
ABSTRACT:
A non-invasive connector for testing an integrated circuit package has a connector housing with a substantially rectangular recess adapted to fit over the integrated circuit package. A plurality of teeth made of an insulative material extend laterally inward from the edges of the connector housing into the recess. The spacing between the teeth is predetermined to enable the teeth to be removably inserted between the integrated circuit leads as said connector housing is fitted in place. Test leads extend from the connector housing into the space between said teeth to make electrical contact with the integrated circuit leads. Electrical connections are provided through the connector housing between these test leads and external testing equipment by means of pins and a flexible circuit assembly. In addition, an elastomeric pad can be positioned between the connector housing and the test leads to exert an inward biasing force against the test leads to maintain electrical contact with the integrated circuit leads. Sliding clips retain the connector in place after it has been fitted over the integrated circuit package.
REFERENCES:
patent: 4084869 (1978-04-01), Yen
patent: 4541676 (1985-09-01), Hansen et al.
patent: 4639058 (1987-01-01), Morgan
patent: 4716500 (1987-12-01), Payne
patent: 4747784 (1988-05-01), Cedrone
patent: 4866374 (1989-09-01), Cedrone
patent: 4917613 (1990-04-01), Kabadi
patent: 5057023 (1991-10-01), Kakadi et al.
McKenzie, Jr. Joseph A.
Steen Michael J.
Wardwell Robert H.
Bradley Paula A.
Hewlett--Packard Company
LandOfFree
Connector assembly for testing integrated circuit packages does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Connector assembly for testing integrated circuit packages, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Connector assembly for testing integrated circuit packages will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2323148