Optical waveguides – Optical waveguide sensor – Including physical deformation or movement of waveguide
Reexamination Certificate
1999-12-27
2001-06-05
Schuberg, Darren (Department: 2872)
Optical waveguides
Optical waveguide sensor
Including physical deformation or movement of waveguide
C385S017000, C385S018000, C385S019000
Reexamination Certificate
active
06243507
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of Invention
This invention relates to a connection verification system in an optical micro-electro-mechanical system (MEMS) crossconnect device.
2. Description of Related Art
Optical crossconnects (OXCs) have emerged as a promising means of carrying out optical-layer provisioning and restoration in future, high-capacity WDM (wavelength-division multiplexing) networks.
As technologies for optical switching advance, enhancing the networking functionality of OXCs has become increasingly important, and doing so via integrated and low-cost approaches becomes particularly desirable. One important requirement for the OXC is connection-verification for network surveillance. That is, it is desired to verify that an optical signal is being properly switched and carried within the system to the desired output port or fiber.
What is still desired is a simple, cost-effective connection verification system for use in a MEMS optical crossconnect network.
SUMMARY OF THE INVENTION
It is therefore an object of the invention to develop a connection path verification system for use in the MEMS OXC.
This and other objects are achieved by the present invention that achieves connection path verification via integrated pilot-tone coding schemes utilizing micro-mirror dithering in the MEMS crossconnect.
In one aspect of the invention, the invention relates to a connection verification system comprising a micro-mirror having an optical signal input side and an optical signal output side, the micro-mirror connected to a substrate, an electrode plate in association with the micro-mirror and capable of dithering the micro-mirror upon application of a dithering signal to the electrode plate, a beam splitter located on the substrate at the optical signal output side of the micro-mirror, and a photodetector positioned beneath the beam splitter.
In a further aspect of the invention, the invention relates to a connection verification system of an optical micro-electro-mechanical crossconnect device, comprising at least one input port and at least one output port, a micro-mirror having an optical signal input side and an optical signal output side, the micro-mirror connected to a substrate, the micro-mirror being positioned on the substrate at a 45° angle to an incoming optical signal from one of the at least one input ports and at a point of intersection of a path from the one input port and one of the at least one output ports, an electrode plate in association with the micro-mirror and capable of dithering the micro-mirror upon application of a dithering signal to the electrode plate, a beam splitter located on the substrate at the optical signal output side of the micro-mirror, and a photodetector positioned beneath the beam splitter.
In a still further aspect of the invention, the invention relates to a method of verifying the connection path of an optical signal from an input port to a desired output port, comprising switching an optical signal from the input port to the desired output port with a micro-mirror having an optical signal input side and an optical signal output side, the micro-mirror connected to a substrate, applying a dithering signal to an electrode plate in association with the micro-mirror to dither the micro-mirror, and splitting the optical signal on the optical signal output side of the micro-mirror into a detection portion and an output portion with a beam splitter located on the substrate at the optical signal output side of the micro-mirror, the beam splitter directing the detection portion of the optical signal to a photodetector located beneath the beam splitter. The connection path is verified when the photodetector detects alterations in intensity of the detection portion of the optical signal corresponding to the dithering signal applied to the electrode plate.
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Goldstein Evan Lee
Lin Lih-Yuan
Lunardi Leda Maria
Assai Fayez
AT&T Corp.
Schuberg Darren
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