Connection terminal and a semiconductor device including at...

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...

Reexamination Certificate

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C439S884000, C438S689000

Reexamination Certificate

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06908311

ABSTRACT:
A first protection film (3) and a second protection film (4) are formed on an electrode pad (2). Bumps (5) are formed at sites where the deposited first and second protection films (3), (4) are both removed. The openings (3a) where the lower, first protection film (3) is removed are larger than the openings (4a) where the upper, second protection film (4) is removed, so that the upper, second protection film (4) has an overhanging structure. The bottom periphery of the bump (5) is formed to extend under the second protection film (4).

REFERENCES:
patent: 6022751 (2000-02-01), Shindo et al.
patent: 6475897 (2002-11-01), Hosaka
patent: 2001/0046011 (2001-11-01), Yasukawa
patent: 260360/1987 (1987-11-01), None
patent: 293671/1987 (1987-12-01), None
patent: 164343/1988 (1988-07-01), None
patent: 305532/1988 (1988-12-01), None
patent: 209725/1991 (1991-09-01), None
patent: 047768/1993 (1993-02-01), None
patent: 198530/1993 (1993-08-01), None
patent: 264541/1996 (1996-10-01), None
patent: 270386/1998 (1998-10-01), None

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