Connection method for probe pins for measurement of...

Details Connection method for probe pins for measurement of... Connection method for probe pins for measurement of...

2006-03-21

2006-03-21

Tokar, Michael (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

C324S212000

Reexamination Certificate

active

07015689

ABSTRACT:
A method of connecting a plurality of probe pins to a plurality of first external connection pads, which are provided on a head gimbal assembly and are electrically connected to a plurality of terminal electrodes of a write magnetic head element, respectively, and a plurality of second external connection pads, which are provided on the head gimbal assembly and are electrically connected to a plurality of terminal electrodes of a read magnetic head element. In the connection method, an approach direction of the probe pins to the first external connection pads and an approach direction of the probe pins to the second external connection pads are made different from each other.

REFERENCES:
patent: 5639266 (1997-06-01), Patel
patent: 6433540 (2002-08-01), Hachisuka et al.
patent: 6479988 (2002-11-01), Hachisuka et al.
patent: 6483298 (2002-11-01), Heim et al.
patent: 6573711 (2003-06-01), Schaenzer et al.

Affiliated with

Also associated with

Rating

Connection method for probe pins for measurement of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Connection method for probe pins for measurement of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Connection method for probe pins for measurement of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3584070