Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1994-12-06
1996-07-30
Snow, Walter E.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324226, 324262, 324761, G01R 2704, G01R 2732, G01R 3102, G01R 2772
Patent
active
055415229
ABSTRACT:
A conformal tip for an open-end coaxial sensor utilized for non-destructive testing of material, includes a first plurality of resiliently retractable pins connected axially with a first conductor of the coaxial sensor and a second plurality of resiliently retractable pins connected axially with a second conductor of the coaxial sensor.
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Baker-Jarvis, et al., "Analysis of an Open-Ended Coaxial Probe with Lift-Off for Nondestructive Testing," IEEE Transactions on Instrumentation and Measurement 43(5): 711-718.
Misra (1987), "A Quasi-Static Analysis of Open-Ended Coaxial Lines," IEEE Transactions on Microwave Theory and Techniques 35(10): 925-928.
Misra (1987), "A Study on Coaxial Line Excited Monopole Probes for In Situ Permittivity Measurements," IEEE Transactions on Instrumentation and Measurement 36(4): 1015-101.
Xu et al. (1991), "Some calculation methods and universal diagrams for measurement of dielectric constants using open-ended coaxial probes", IEE Proceedings-H 138(4): 356-360.
Zheng et al. (1991), "Permittivity Measurements Using a Short Open-Ended Coaxial Line Probe", IEEE Microwave and Guided Wave Letters 1(11): 337-339.
Zheng et al. (1992), "Theoretical and Experimental Study of Measurement of Microwave Permittivity Using Open Ended Elliptical Coaxial Probes," IEEE Transactions on Microwave Theory and Techniques 40(1): 143-150.
Lizza Mark A.
Rosen Mark D. A.
Scheno Paul J.
Anderson Terry J.
Hoch Jr. Karl J.
Northrop Grumman Corporation
Snow Walter E.
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