Confocal self-interference microscopy from which side lobe...

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S370000, C359S371000, C359S385000

Reexamination Certificate

active

11444686

ABSTRACT:
The present invention relates to confocal self-interference microscopy. The confocal self-interference microscopy further includes a first polarizer for polarizing reflected or fluorescent light from a specimen, a first birefringence wave plate for separating the light from the first polarizer into two beams along a polarizing direction, a second polarizer for polarizing the two beams from the first birefringence wave plate, a second birefringence wave plate for separating the two beams from the second polarizer into four beams along the polarizing direction, and a third polarizer for polarizing the four beams from the second birefringence wave plate, in the existing confocal microscopy. Optic-axes of the first and second birefringence wave plates exist on the same plane, optic-axes of the first and second birefringence wave plates are inclined from an optical axis of the entire optical system at a predetermined angle, and self-interference spatial periods of the first and second birefringence wave plates are different from each other.

REFERENCES:
patent: 5764363 (1998-06-01), Ooki et al.
patent: 2001/0040723 (2001-11-01), Kusaka
patent: 03 91709 (1991-04-01), None
Neil et al., Optimized pupil-plane filters for confocal microscope point-spread function engineering,Optics Letters, vol. 25, No. 4, Feb. 15, 2000, pp. 245-247.
Kany et al., Enhancement of lateral resolution in confocal self-interference microscopy,Optics Letters, vol. 28, No. 24, Dec. 15, 2003, pp. 2470-2472.

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